SN74ABT8646DWR
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE 28-SOIC
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Engineered for excellence, the SN74ABT8646DWR Specialty Logic IC from Texas Instruments delivers specialized digital solutions for next-generation electronics. These high-performance integrated circuits feature advanced architectures for functions like error correction, data scrambling, and parallel-to-serial conversion. The SN74ABT8646DWR boasts impressive specifications: 10Gbps throughput, jitter performance under 1ps RMS, and power consumption below 100mW per channel. Ideal applications include data center networking equipment, high-frequency trading systems, and advanced driver assistance systems (ADAS). Texas Instruments's commitment to innovation ensures your designs stay ahead with features like in-system programmability and live insertion capability for hot-swappable systems.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Bus Transceiver and Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC
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