SN74ABT8646DWRG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE 28SOIC
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Texas Instruments's SN74ABT8646DWRG4 Specialty Logic ICs provide intelligent solutions for sophisticated digital systems. These versatile integrated circuits incorporate advanced features like dynamic phase adjustment, glitch-free switching, and fail-safe input protection. The SN74ABT8646DWRG4 series supports operation from 1.8V to 3.3V core voltages with 5V-tolerant inputs, simplifying mixed-voltage system design. Application highlights include enterprise storage systems, industrial automation controllers, and next-generation gaming hardware. Texas Instruments backs every SN74ABT8646DWRG4 IC with comprehensive technical documentation, evaluation kits, and world-class application engineering support to ensure your design success from prototype to production.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Bus Transceiver and Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC
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