SN74ABTH182652APM
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE 18BIT 64LQFP
$16.27
Available to order
Reference Price (USD)
160+
$15.89313
Exquisite packaging
Discount
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Meet the SN74ABTH182652APM - Texas Instruments's high-reliability Specialty Logic IC for mission-critical applications. These ruggedized integrated circuits feature enhanced EMC performance, single-event upset (SEU) immunity, and predictive fault detection algorithms. The SN74ABTH182652APM delivers industry-leading MTBF ratings exceeding 1 million hours, making it ideal for defense systems, oil/gas exploration equipment, and railway signaling infrastructure. Key differentiators include our patented noise cancellation technology and -55 C to +150 C junction temperature operation. Trust Texas Instruments's decades of experience in high-reliability semiconductor manufacturing for your most challenging environments.
Specifications
- Product Status: Active
- Logic Type: Scan Test Device With Transceivers And Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 18
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 64-LQFP
- Supplier Device Package: 64-LQFP (10x10)
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