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SN74LVTH182502APM

Texas Instruments
SN74LVTH182502APM Preview
Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-LQFP
$6.72
Available to order
Reference Price (USD)
1+
$6.72000
500+
$6.6528
1000+
$6.5856
1500+
$6.5184
2000+
$6.4512
2500+
$6.384
Exquisite packaging
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Specifications

  • Product Status: Active
  • Logic Type: ABT Scan Test Device With Universal Bus Transceivers
  • Supply Voltage: 2.7V ~ 3.6V
  • Number of Bits: 18
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 64-LQFP
  • Supplier Device Package: 64-LQFP (10x10)

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