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SN74ABT8543DWR

Texas Instruments
SN74ABT8543DWR Preview
Texas Instruments
IC SCAN TEST DEVICE 28-SOIC
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Specifications

  • Product Status: Obsolete
  • Logic Type: Scan Test Device with Registered Bus Transceiver
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 8
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 28-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package: 28-SOIC

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